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Comparison of LFSR and CA for BIST
This paper presents two techniques: Linear Feedback Shift Register (LFSR) and Cellular Automata (CA), used for test pattern generation and test response
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AMD-K5 Processor
The BIST runs a linear feedback shift register (LFSR) signa- ture test on the microcode ROM in parallel with a March C test on the instruction cache, data
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A Statistical Test Suite for Random and Pseudorandom
by EB Smid Cited by 14 comparing the bits within that window against the template. If there is no The focus of this test is the length of a linear feedback shift register (LFSR).
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