Work in redline in XPS

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Aug 6th, 2022
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How to work in redline in XPS

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Charles Zona (CZ): Hello, and welcome to another McCrone Group webinar. My name is Charles Zona, and today we are happy to welcome Doug Meier. Doug is going to talk to us about X-ray photoelectron spectroscopy, otherwise known as XPS. Before we get started I would like to give you a bit of Dougamp;#39;s background. Doug is a senior research scientist with McCrone Associates. He specializes in surface sensitive spectroscopies, such as Auger electron, X-ray photoelectron, infrared reflection absorption, thermal desorption, and low-energy electron diffraction. Doug was awarded the U.S. Department of Commerceamp;#39;s Silver Medal for his work in the development of conductometric chemical microsensor array technology for the detection of chemical warfare agents. He also has over ten years of micro beam analysis experience prior to joining McCrone Associates. Doug will field questions from the audience immediately following todayamp;#39;s presentation, and this webinar is being recorded

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The main cause of the peak shift in XPS spectra is mostly related to chemical shifts due to the presence or absence of the chemical states of the element having different formal oxidation state. And the intensity may also be changed bcos it is directly linked to the number of atoms in the respective chemical state.
The electronic work function is acquired spectroscopically by measuring the difference between the Fermi Level and the cutoff of the tail at the low kinetic energy end of the spectrum (a.k.a. spectrum width) and subtracting this value from the incident photon energy.
A mass spectrometer is an analytical instrument that is used to identify the amount and type of chemicals present in a sample by measuring the mass-to-charge ratio and abundance of gas-phase ions.
Chemical shift arises in the initial state from the displacement of the electronic charge from the atom towards its ligands, reducing the electrostatic potential at the atom. There is a final state shift due to the polarization of the ligand by the core on the central atom.
XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to. The technique can be used in line profiling of the elemental composition across the surface, or in depth profiling when paired with ion-beam etching.
A spectrometer is any instrument used to probe a property of light as a function of its portion of the electromagnetic spectrum, typically its wavelength, frequency, or energy. The property being measured is usually intensity of light, but other variables like polarization can also be measured.
Ultraviolet photoelectron spectroscopy (UPS) is an important technique for measuring the energies of the valence states of metallic, semiconducting and adsorbate-covered metal and semiconducting surfaces. Applications include catalysis, organic electronics, optoelectronic devices and photovoltaics.
The work function is a correction factor for the instrument and correlates to the minimum energy required to eject an electron from an atom (see the photoelectric effect for more info, but not necessary to understand this).

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