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these data represent an XPS depth profile an iron beam has been used to sputter the surface and after each cycle of the iron beam a set of Spectra are acquired and from these Spectra we would like to calculate a profile that indicates how these different elements vary as a function of depth so the way we would construct a depth profile is to define a back ground using the quantification parameters dialog window and then integrate the signal above the background for each one of these Spectra Iamp;#39;ve created a data file previously where Iamp;#39;ve added these regions and Iamp;#39;ve made use of a parameter which is the average width the average width which is easily demonstrated by changing it is a set of data bins that are averaged to determine the point at which the background should meet the data at the start and the end of each region and using a larger number of average width points means that you stabilize the background and therefore the calculation of the background is mo
