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xps is not a bulk analysis technique if you look in any literature its called a surface analysis technique it gives you chemical analysis very neatly of the top outer 10 nanometers thats about 30 atomic layers and is considerably different most of the time to the bulk because the sample has been exposed to some solution being exposed to the air some samples are very reactive and so you get a different chemical composition on the outer surface than you do into the bulk heres a few things 10 amp strongs one nanometer we look at about 10 nanometers about a hundred amstrongs quite different from the x-ray techniques of the microscope where were looking at one to five microns down now theres many surface analysis techniques you go into the literature youll probably see 20 or 30 techniques sam scanning oj secondary ion mass spectrometry atomic force microscopy etc etc i think by far the most important is xps earlier referred to as eska electron spectroscopy for chemical analysis why i
