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sample mounting for SEM powdered samples this video is brought to you by the electron microscope unit at the University of New South Wales mark Wainwright analytical centre a note of the microscopy Australia network by powdered sample we mean a sample composed of many fine dry particles of material with dimensions in the micron scale examples include starch sand and pollen when mounting powdered samples for SEM our main goals are to secure the sample particles to the SEM stub so that they do not move during SEM examination and to ensure the negative charge generated by the electron beam has a pathway away from the surface of the particles to the conductive adhesive and stub base to achieve this the powder particles must be spread as thinly and evenly across the adhesive as possible in order to maximize the conductivity of the sample if the particles are piled on top of each other it is likely that there will be problems with imaging and analysis due to poor conductivity and poor sample
