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Physical Electronics has introduced a new XPS software feature called image registration, enhancing small area XPS analysis by ensuring precise analysis at the desired location. This feature, previously only available for OJays spectroscopy, utilizes SX I x-ray imaging to perform analysis on very small features like metallized wafer pads, solder balls, and particles of manganese carbonate. During setup, distinct features and search areas are defined to adjust the x-ray beam position accurately after a stage move.
