Rub out formula in XPS

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Aug 6th, 2022
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How to rub out formula in XPS

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Hello, my name is Charles Zona and I would to welcome everyone to todayamp;#39;s McCrone Group webinar. Our presenter is Kent Rhodes of McCrone Associates. Kent is going to talk to us about using x-ray photoelectron spectroscopy, or XPS, for industrial problem solving. Before we started I will give you a bit of Kents background. Kent is the Senior Vice President and Technical Director of McCrone Associates. In addition to his management of technical surfaces at McCrone Associates, he also performs surface analysis using XPS, secondary ion mass spectrometry, and electron microprobe analysis. Kent has also taught the Scanning Electron Microscopy course here at Hooke College of Applied Sciences. Kent will field questions from the audience immediately following todayamp;#39;s presentation. This webinar is being recorded and will be available on The McCrone Group website under the webinars tab and now I will hand the program over to Kent. Hello and good afternoon. Thank you for joining u

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The chemical environment of an atom alters the binding energy (BE) of a photoelectron which results in a change in the measured kinetic energy (KE). The BE is related to the measured photoelectron KE by the simple equation; BE = h - KE where hv is the photon (x-ray) energy.
KE = h-BE Equation 1 The relative photoelectron peak intensities are controlled by the relative probability for each orbital level to undergo photoionization at the h value being used (either Alk at 1486.6ev or Mgk at 1254.4 ev for standard laboratory based XPS instrumentation).
XPS spectra are, for the most part, quantified in terms of peak intensities and peak positions. The peak intensities measure how much of a material is at the surface, while the peak positions indicate the elemental and chemical composition.
Quantitative XPS is the process of comparing two or more intensities in XPS spectra to determine the amount of mate- rial at the surface of a sample. These intensities may be from the same peak or different peaks in the same spectrum or the same set of peaks in different spectra.
Typical samples for XPS are 5 mm to 10 mm square and up to 4 mm thick. Thicker samples may also be accommodated - please contact us for details.
Chemical shift arises in the initial state from the displacement of the electronic charge from the atom towards its ligands, reducing the electrostatic potential at the atom. There is a final state shift due to the polarization of the ligand by the core on the central atom.
The ratio D = Ap/B of the XPS peak area Ap to the increase in background signal 30 eV below the peak energy is evaluated under variation of the path length R travelled by the photoelectron, the XPS peak energy Ep, and the particular metal M.

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