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quantification by XPS is typically reported as a quantification table involving atomic concentrations from this table we can also calculate formulae that indicate the relative amounts of the material and these are all calculated in this instance from a set of quantification regions applied to the oxygen the silicon and the carbon with the result that we see for this fused silica sio2 relationship between silicon and oxygen and then in addition we have some contamination in the form of carbon atomic concentrations are calculated from regions and these regions define background for each one of these photo emission peaks and the peak area above background is integrated then for each one of these Peaks there are scaling factors that must be applied so that we can measure the amount of substance based on a photo emission peak and the subject of this video is to look at these various correction factors and illustrate how they are applied to these data to produce a quantification that makes s
