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in the server scientific nexor is our latest at XPS system it combines high quality XPS with multiple techniques such as reals Elias s so for a typical serving conductor lab XPS can be used a failure analysis or product development semiconductor device performance is related to the thickness of the Heike material for example and that could be measured with XPS scientists studying server conductors while accurate results of course but perhaps more importantly they want repeatable results and precision the high sensitivity of a nectar is one of its features that drives that precision XPS measures photoelectron intensity and not thicker xamp;#39; directly but by building a model in the albumamp;#39;s higher software we can take that photoelectron information and convert it into a film thickness what are the semiconductors ivko more and more complex and so you canamp;#39;t actually do a full and comprehensive analysis just one technique in order to characterize it fully you need to have