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one of the features of angle resolve data are the large numbers of spectra that can be acquired from the same sample this sample is a silicon wafer with a native oxide layer and by tilting the sample either using the lens system to achieve this or by physically tilting the sample using a stage has resulted in a set of silicon 2p spectra which exhibit both elemental silicon which youamp;#39;d expect and an oxide peak and because we have docHub numbers of spectra to look at itamp;#39;s possible to do a number of data treatments thatamp;#39;ll show that these data actually consists of the elemental and two different forms of silicon oxide while we believe there are two different forms of oxide within these data the highly correlated nature of the oxide peak makes it quite difficult to create a peak model and have a high degree of confidence that you really have proportioned the silicon dioxide from the SI 203 signal and so what weamp;#39;re going to do is perform some data treatm
