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letamp;#39;s now move to variation one thing which is very common in advanced node design is the fact that process and voltage variability at advanced nodes is becoming a major headache for design teams across the industry teams are having to characterize their libraries at three sigma and five sigma deal with all types of statistical correlation issues and then do rapid diagnosis of parametric yield failures in order to improve the robustness of their designs our prime shield environment directly attacks this problem by making design robustness central to our analysis methodology by measuring the robustness of the design and optimizing it we can make a big dent in addressing the variability challenge the sensitivity analysis enables design teams to look at possible parametric yield fails during the design construction and sign off and then take corrective action to make the design more robust this helps surprises that happen much later during the post-silicon phase and thereb
