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welcome everybody so uh today i will share with you some of the new developments and applications um of lab-based hackspace using our phi quantum scanning xps microprobe instrument so for functional material characterization there is a set of analytical tools that analysts are have in access to their study um the type of information that people are looking into is composition chemical speciation amount of dopants morphological uh properties more novel materials may require band structure characterization as you can see xps provides a lot of information for functional materials it is one of the most commonly matters due to mainly its capability not only to provide elemental composition but also chemical composition the sampling depth of xps is 5 to 10 nanometers which makes it also very advantageous for surface analysis specifically but at the same time new materials uh have interfaces that may be thicker than xps sampling types or electronic materials for example there may be a capping