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hi and welcome to this presentation on sample handling preparation and mounting for xps and other surface analysis methods and i want to first thank the organizers for inviting me to talk at this workshop this talk is based primarily on two references which are part of a collection internal vacuum science and technology and this particular set is referenced as you can see with this notation here and the idea is to help educate people with regard to various aspects of xps and prevent problems with bad information thats gotten out of literature the first paper is a sample preparation and mounting technique paper and the other authors are roberto garcia of nc state jeff schallenberger from the penn state university john newman from physical electronics and kerry donnelly from university of north carolina the other paper was put together by carrie donnelly and i and is an introduction to xps why are we doing this talk well surface analysis requires surfaces that have not been compromised