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Hello, today Iamp;#39;d like to show you how we can use ChI-Scan and integrated EDS and EBSD data to resolve crystallographically similar phases for more accurate microstructural characterization. So, I have here a data set that was collected. If we look at the image quality map, will see the microstructure here. Itamp;#39;s an interconnect device for a microelectronic circuit. If we look at the orientation map, we see that weamp;#39;ve resolved the grains nicely; we see the microstructure. But if we look at the phase map, weamp;#39;re going to see itamp;#39;s very noisy and thatamp;#39;s because one of the phases in austenitic iron nickel phase another one is a copper phase, but both of these phases are face-centered cubic. That means that the EBSD patterns for these two phases look very similar for any given orientation and itamp;#39;s difficult to differentiate these with traditional Hough-based pattern indexing. So what we can do, we can use EDS information. If we look at ou
