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good morning my name is Ben Schmitt from physical electronics this was a paper presented at Akasha 17 in Montpellier France and the talk focuses on using iron cluster beams to depth profile through inorganic and organic materials with the idea to give users practical operating conditions to for these type of materials now as we all know mono atomic argon has been the primary sputtering beam for for many years and we are typically dealing with more and more materials that are multi-layer systems that do have features of interest below the usual XPS information depth of about 10 nanometers and so we if we want to investigate those deeper layers we need to use some sort of depth profiling mechanism to investigate those surfaces in particular new materials are being introduced that combine both organic and inorganic components for example organic electronics where we have organic active layers sandwiched between metallic electrodes or inorganic electrodes we also have biomaterials where we
