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the point of this video is to examine some of the techniques that can be used to analyze data when the data may be low signal to noise the low signal to noise is related to low count rates which may be caused by analyzing a small area of a thin film that necessarily has low signal to noise and this is an example that we see here from a sample where a molybdenum disulfide flake is measured using a stack of images and the images themselves will take a considerable length of time to acquire but nevertheless because were analyzing a small area and a thin film that the signal itself is relatively poor compared to the noise if wed used a bulk material and a large area analysis then you might expect the type of signal to noise that we see here however when we limit the availability of signal then what we have to do is find ways to improve the sensitivity of an instrument or extend the acquisition time so that we can then try to obtain the type of signal that we can generally interpret usin