Clear up trait in XPS

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Aug 6th, 2022
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How to clear up trait in XPS

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Hello, my name is Charles Zona and I would to welcome everyone to todayamp;#39;s McCrone Group webinar. Our presenter is Kent Rhodes of McCrone Associates. Kent is going to talk to us about using x-ray photoelectron spectroscopy, or XPS, for industrial problem solving. Before we started I will give you a bit of Kents background. Kent is the Senior Vice President and Technical Director of McCrone Associates. In addition to his management of technical surfaces at McCrone Associates, he also performs surface analysis using XPS, secondary ion mass spectrometry, and electron microprobe analysis. Kent has also taught the Scanning Electron Microscopy course here at Hooke College of Applied Sciences. Kent will field questions from the audience immediately following todayamp;#39;s presentation. This webinar is being recorded and will be available on The McCrone Group website under the webinars tab and now I will hand the program over to Kent. Hello and good afternoon. Thank you for joining u

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How XPS works. X-rays (photons) are shot onto a sample, and when electrons in the sample absorb enough energy, they are ejected from the sample with a certain kinetic energy. The energy of those ejected electrons is analyzed by a detector and a plot of these energies and relative numbers of electrons is produced.
X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) is a technique which analyzes the elements constituting the sample surface, its composition, and chemical bonding state by irradiating x-rays on the sample surface, and measuring the kinetic energy of the photoelectrons emitted
XPS can measure elemental composition as well as the chemical and electronic state of the atoms within a material. XPS spectra are obtained by irradiating a solid surface with a beam of X-rays and measuring the kinetic energy of electrons that are emitted from the top 1-10 nm of the material.
An Auger peak represents the kinetic energy of an auger electron which changes with the energy of primary xrays. Thus, auger peak will shift in apparent binding energy in xps spectrum when x ray source is changed.
A further source for structure in an XPS spectrum is that of two intrinsic energy loss processes. So called, Shake-up peaks appear at energies characteristic of the excited states for an element with respect to the state measured by the zero loss intensity.
X-Ray Photoelectron Spectroscopy is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-100 . XPS Spectroscopy can also be used for sputter depth profiling.
XPS is used to characterize the surfaces of diverse materials such as inorganic compounds (minerals), semiconductors, organic compounds, and thin films and coatings on natural and engineered materials.

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