Clear up sample in XPS

Your easy way to clear up sample in XPS

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When you're in, click New Document and upload it from your device, external URL, or cloud.
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How to clear up sample in XPS

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all right guys Mark here from Harwell XPS back with another video and today weamp;#39;re going to be looking at um some sample damage in XPS and how we can uh compensate for this and overcome some of the difficulties involved when you do have sample damage so to get us started weamp;#39;re going to have a look at a couple of things here weamp;#39;re going to start off by looking a little bit at some soft materials so some of the work weamp;#39;ve done on um materials that arenamp;#39;t particularly stable in uhv followed by a look at some seral based uh materials seral of of course a very um important material in a lot of things like catalysis um energy materials Etc and finally just a couple of solutions how we can overcome some of the challenges involved with uh x-ray damage so if youamp;#39;re not familiar when you have materials in a uhv system uh X-ray and electromagnetic radiation can actually do some kind of damage uh to your systems uh exactly the processes of those depen

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Why are tweezers used during XPS sample preparation?

XPS can detect submonolayer coverages, so proper sample handling is essential. As mentioned above, gloves should be worn and clean metal tweezers used to handle the sample without contacting the area of interest.

What is the sampling depth of XPS?

The average depth of analysis for an XPS measurement is approximately 5 nm. PHI XPS instruments provide the ability to obtain spectra with a lateral spatial resolution as small as 7.5 m. Spatial distribution information can be obtained by scanning the micro focused x-ray beam across the sample surface.

What do the peaks on XPS mean?

Each element produces a set of characteristic XPS peaks. These peaks correspond to the electron configuration of the electrons within the atoms, e.g., 1s, 2s, 2p, 3s, etc. The number of detected electrons in each peak is directly related to the amount of element within the XPS sampling volume.

Is XPS non-destructive?

The XPS (X-ray Photoelectron Spectroscopy) is one of the typical non-destructive analyzing methods.

Does XPS require vacuum?

XPS measurements are conducted under ultra-high vacuum ( 10- 8 Torr) in order to avoid collision between photoelectrons and gas molecules in the spectrometer, and minimize surface contamination from residual gases.

What is the amount of sample required for XPS analysis?

The sample size requirements are instrument dependent. The maximum sample size that can be analyzed in most XPS instruments is on the order of 20 cm2 and often on the order of a few cm2. Allowed sample heights are also instrument dependent, but typically are 25 mm.

How to prepare samples for XPS?

XPS Sample Preparation: Press the powder into clean, high purity indium foil. Dissolve the powder in a suitable solvent and then drop cast onto the surface of a clean silicon wafer. Sprinkle the powder onto the surface of sticky carbon conductive tape or pressed into a tablet for analysis.

What can XPS tell us about a sample?

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a technique for analyzing a materials surface chemistry. XPS can measure elemental composition as well as the chemical and electronic state of the atoms within a material.

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