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there are a few complexities that are common for many thin films two of these complexities are surface roughness and index grading where index changes with depth through the film complete e has an automated feature to test these complexities and to demonstrate this Iamp;#39;m working with a silicon carbide film on Silicon Iamp;#39;ve already created a starting model using a Koshi layer to represent the film the film is approximately 766 Nom with an index near 2.3 but itamp;#39;s obvious that the fit can be improved if I scroll down below the model and expand other options thereamp;#39;s a feature called try alternate models this feature will automatically try surface roughness index grading and both simultaneously so Iamp;#39;m going to do that now a new window appears with the analysis results of adding each complexity roughness grading and then both compared to the ideal model the software makes a recommendation which is highlighted in green and this is based purely on the Impro
