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hello everyone thanks for signing in today has been mentioned my name is John Newman Iamp;#39;m the director of the analytical labs here are physical electronics and today Iamp;#39;d like to talk about two very complementary techniques x-ray photoelectron spectroscopy and time-of-flight sims for the analysis of organic materials this isnamp;#39;t to say that these techniques arenamp;#39;t also good for inorganic materials but weamp;#39;re going to focus primarily on organic analysis in this in this presentation as you probably know XPS provides the quantitative analysis and the short-range bonding chemical information for materials and elements on the sample on the outermost surface while toff sims provides more the molecular picture of whatamp;#39;s going on on the surface and you get can get the the identity or or nail down the species that are present on that surface and Iamp;#39;ll show you examples of that it also is a very good imaging technique mapping technique and so yo
