Clean up field in XPS

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Aug 6th, 2022
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Do it like a pro – clean up field in XPS

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People often need to clean up field in XPS when managing documents. Unfortunately, few programs provide the options you need to complete this task. To do something like this typically requires alternating between several software packages, which take time and effort. Luckily, there is a solution that works for almost any job: DocHub.

DocHub is a professionally-built PDF editor with a complete set of valuable features in one place. Editing, approving, and sharing paperwork is easy with our online solution, which you can use from any internet-connected device.

Your brief guideline on how to clean up field in XPS online:

  1. Go to the DocHub website and register an account to access all our features.
  2. Add your file. Press New Document to upload your XPS from your device or the cloud.
  3. Edit your file. Make use of the powerful tools from the top toolbar to improve its content.
  4. Save your updates. Click Download/Export to save your altered paperwork on your device or to the cloud.
  5. Send your documents. Select how you want to share it: as an email attachment, a Sign Request, or a shareable link.

By following these five easy steps, you'll have your revised XPS quickly. The intuitive interface makes the process quick and efficient - stopping jumping between windows. Try DocHub today!

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How to clean up field in XPS

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Charles Zona (CZ): Hello, and welcome to another McCrone Group webinar. My name is Charles Zona, and today we are happy to welcome Doug Meier. Doug is going to talk to us about X-ray photoelectron spectroscopy, otherwise known as XPS. Before we get started I would like to give you a bit of Dougamp;#39;s background. Doug is a senior research scientist with McCrone Associates. He specializes in surface sensitive spectroscopies, such as Auger electron, X-ray photoelectron, infrared reflection absorption, thermal desorption, and low-energy electron diffraction. Doug was awarded the U.S. Department of Commerceamp;#39;s Silver Medal for his work in the development of conductometric chemical microsensor array technology for the detection of chemical warfare agents. He also has over ten years of micro beam analysis experience prior to joining McCrone Associates. Doug will field questions from the audience immediately following todayamp;#39;s presentation, and this webinar is being recorded

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An Auger peak represents the kinetic energy of an auger electron which changes with the energy of primary xrays. Thus, auger peak will shift in apparent binding energy in xps spectrum when x ray source is changed.
In the example of proton NMR, these peaks are not the result of proton-proton coupling, but result from the coupling of 1H atoms to an adjoining 13C atom. These small peaks are known as carbon satellites as they are small and appear around the main 1H peak i.e. satellite (around) to them.
The main cause of the peak shift in XPS spectra is mostly related to chemical shifts due to the presence or absence of the chemical states of the element having different formal oxidation state. And the intensity may also be changed bcos it is directly linked to the number of atoms in the respective chemical state.
For some materials, plasmon loss peaks may occur. These involve an enhanced probability for loss of a specific amount of energy due to the interaction between the photoelectron and other electrons.
These satellite peaks arise from localized charge transfer excitations that accompany the creation of a core hole 2. The presence and intensity of these satellite peaks can be used to determine the covalent character of the interaction between the Cd cation and the oxygen ligands 3.
XPS measurements are conducted under ultra-high vacuum ( 10- 8 Torr) in order to avoid collision between photoelectrons and gas molecules in the spectrometer, and minimize surface contamination from residual gases.
Shake-up: The outgoing electron interacts with a valence electron and. excites it (shakes it up) to a higher energy level. As a consequence the. energy core electron is reduced and a satellite structure appears a few eV below (KE scale) the core level position.
X-Ray Photoelectron Spectroscopy is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-100 . XPS Spectroscopy can also be used for sputter depth profiling.

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