You no longer have to worry about how to blot trait in XPS. Our comprehensive solution provides straightforward and fast document management, enabling you to work on XPS documents in a couple of moments instead of hours or days. Our service includes all the features you need: merging, inserting fillable fields, signing forms legally, adding shapes, and so on. There’s no need to set up additional software or bother with costly applications requiring a powerful computer. With only two clicks in your browser, you can access everything you need.
Start now and handle all various types of files like a pro!
Charles Zona (CZ): Hello, and welcome to another McCrone Group webinar. My name is Charles Zona, and today we are happy to welcome Doug Meier. Doug is going to talk to us about X-ray photoelectron spectroscopy, otherwise known as XPS. Before we get started I would like to give you a bit of Dougamp;#39;s background. Doug is a senior research scientist with McCrone Associates. He specializes in surface sensitive spectroscopies, such as Auger electron, X-ray photoelectron, infrared reflection absorption, thermal desorption, and low-energy electron diffraction. Doug was awarded the U.S. Department of Commerceamp;#39;s Silver Medal for his work in the development of conductometric chemical microsensor array technology for the detection of chemical warfare agents. He also has over ten years of micro beam analysis experience prior to joining McCrone Associates. Doug will field questions from the audience immediately following todayamp;#39;s presentation, and this webinar is being recorded