Blot trait in XPS

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Aug 6th, 2022
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How to blot trait in XPS

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Charles Zona (CZ): Hello, and welcome to another McCrone Group webinar. My name is Charles Zona, and today we are happy to welcome Doug Meier. Doug is going to talk to us about X-ray photoelectron spectroscopy, otherwise known as XPS. Before we get started I would like to give you a bit of Dougamp;#39;s background. Doug is a senior research scientist with McCrone Associates. He specializes in surface sensitive spectroscopies, such as Auger electron, X-ray photoelectron, infrared reflection absorption, thermal desorption, and low-energy electron diffraction. Doug was awarded the U.S. Department of Commerceamp;#39;s Silver Medal for his work in the development of conductometric chemical microsensor array technology for the detection of chemical warfare agents. He also has over ten years of micro beam analysis experience prior to joining McCrone Associates. Doug will field questions from the audience immediately following todayamp;#39;s presentation, and this webinar is being recorded

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When laboratory X-ray sources are used, XPS easily detects all elements except hydrogen and helium. The detection limit is in the parts per thousand range, but parts per million (ppm) are achievable with long collection times and concentration at top surface.
XPS is a powerful quantitative technique for determining the electronic structure, elemental composition, and oxidation states of an element in a material.
How to Analyze XPS Spectra Data XPS analysis is rooted in understanding the position and intensity of peaks on the survey scans and the high-resolution spectra data. The binding energy is calculated from the difference in the energy of the x-ray source and the kinetic energy of the photoelectron being detected.
Each element produces a set of characteristic XPS peaks. These peaks correspond to the electron configuration of the electrons within the atoms, e.g., 1s, 2s, 2p, 3s, etc. The number of detected electrons in each peak is directly related to the amount of element within the XPS sampling volume.
The Oxidation state of any element/ ion from XPS by matching the binding energy positions of observed spectrum to reported literature.
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a technique for analyzing a materials surface chemistry. XPS can measure elemental composition as well as the chemical and electronic state of the atoms within a material.
How to interpret the data it generates Peaks from the XPS spectra give relative number of electrons with a specific binding energy. The shorter the peak, the less electrons represented. The greater the binding energy, the greater the attraction of that electron to the nucleus.
In viewing the photoelectron spectrum of an element, you are also able to: Distinguish the different orbital levels in an atom. Determine the electron configuration of an atom. Each peak in a photoelectron spectrum represents a different orbital level where electrons can be found.

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