Blot ssn in XPS

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Aug 6th, 2022
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How to blot ssn in XPS

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letamp;#39;s discuss xps xps stands for x-ray photoelectron spectroscopy in this characterization technique we basically bombard x-ray on a material surface and we eject electrons so those ejected electrons are called photoelectrons because the electrons are ejected due to photon and the word spectroscopy means whenever electromagnetic radiation interact with a material so we get spectrum or we get graph so that particular field when electromagnetic radiation is interacting with a material so that fuel required spectroscopy we get a graph and the graph is basically the relation between the binding energy and the number of electron detected this vertical is basically the intensity mean the number of electrons detected so if we eject more number of electrons we will get ah more uh counting here and we will get high peak here so we understood if we get low peak here this means that the number of g electron are less if you get higher peak mean the number of ejected electron are higher the

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The lower curve presents the spectrum of a hydrocarbon polymer polyethylene, where only a carbon peak is observed. Hydrogen cannot be detected by XPS because there are no core electrons [6] . We can also observe some oxygen, which is a consequence of surface contamination.
Knowledge of the incoming photon energy and measurement of the kinetic energy via an electron analyzer makes it possible to calculate the binding energy: Eb = hn + Ek + f, where f is the work function of the spectrometer.
While AES is a very valuable surface analysis technique, there are limitations. Because AES is a three-electron process, elements with less than three electrons cannot be analyzed. Therefore, hydrogen and helium cannot be detected.
Both hydrogen and helium cannot be detected using XPS. For this reason, XPS can provide only relative, rather than absolute, ratios of elements in a sample.
While the emission of X-rays (process (i)) produces singly ionized atoms, the emission of Auger electrons (process (ii)) results in doubly ionized atoms. Because Auger is a three-electron process, hydrogen and helium cannot be detected by this technique.
XPS spectral lines are identified by the shell from which the electron was ejected (1s, 2s, 2p, etc.). The ejected photoelectron has kinetic energy: KE=hv-BE-! L electron falls to fill core level vacancy (step 1).
XPS Limitations Detection limits typically ~ 0.1 at% Smallest analytical area ~30 m. Limited specific organic information (no long-range bonding information) Sample must be UHV compatible.
C-C peak at 284.8eV is frequently used a charge correction reference because of its convenience. Not always reliable, possibly changing with nature of the surface hydrocarbon, film thickness and nature of the sample.

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