Bind feature in XPS

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Aug 6th, 2022
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Your quick guide to bind feature in XPS with DocHub:

  1. Upload your XPS file into your DocHub account.
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  3. Use powerful editing tools to make any adjustments to your record.
  4. Once completed, click Download/Export and save your XPS to your device or cloud storage.
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How to bind feature in XPS

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ah in this lecture we will be looking at a specific spectroscopy tool ah which has been widely used in materials chemistry and as the title suggests there are two issues that are involved in the spectroscopy the name suggests that it is a x-ray photoelectron spectroscopy therefore there is a x-ray that is produced when a photoelectron is ejected so a combination of ah two processes that are happening brings about a very rich chemistry that one can learn material scientists physicist and chemist have used this technique extensively and this is now a very established tool for characterization materials in the last three decades improvised and very sophisticated instruments have come in the in the last 2 decades the machine could actually occupy a very big room but today the sophistication of this instrumentation has moved such a way that even a benchtop x-ray photoelectrons spectrophotometer can be used so we will look into this issue of what this principle behind the spectroscopic tool

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XPS spectral lines are identified by the shell from which the electron was ejected (1s, 2s, 2p, etc.). The ejected photoelectron has kinetic energy: KE=hv-BE-! L electron falls to fill core level vacancy (step 1).
The chemical environment of an atom alters the binding energy (BE) of a photoelectron which results in a change in the measured kinetic energy (KE). The BE is related to the measured photoelectron KE by the simple equation; BE = h - KE where hv is the photon (x-ray) energy.
In equation form, this is given by KEe = hf BE, where KEe is the maximum kinetic energy of the ejected electron, hf is the photons energy, and BE is the binding energy of the electron to the particular material. (BE is sometimes called the work function of the material.)
The shifts in the XPS peak is related to its oxidation state and higher shift in binding energy corresponds to higher oxidation state.
Knowledge of the incoming photon energy and measurement of the kinetic energy via an electron analyzer makes it possible to calculate the binding energy: Eb = hn + Ek + f, where f is the work function of the spectrometer.
The XPS binding energy of an atom is a measure of the electronic environment of the atom. Decreasing the electron density of an atom (such as a C-O bond compared with a C-C bond) increases the binding energy of the atom.
Adventitious carbon contamination is commonly used as a charge reference for XPS spectra. C1s spectrum for contamination typically has C-C, C-O-C, and O-C=O. components. The C-C component may be set to a binding energy of 284.8eV, by default.
Here, binding energy is the energy of an electron attracted to a nucleus; photon energy is the energy of X-ray photons being used by the spectrometer, and the kinetic energy is the energy of the ejected electrons from the sample.

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