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[Music] physical electronics is excited to introduce a new XPS software feature called image registration this optional smartsoft add-on which is previously only available for OJays spectroscopy greatly enhances small area xbs analysis image registration is coupled with Phis unique SX I x-ray imaging capability to ensure XPS analysis is performed at the precise location of interest even for very small features in this demonstration image registration will be used during the analysis for three different samples a metallized wafer pad a solder ball and a particle of manganese carbonate as with typical small area analysis and SX I is generated for each feature and the point or points of interest are selected this SX I image can then be designated as a reference image for image registration during image registration setup two areas are defined distinct feature and a search area the distinct feature will be used to adjust the x-ray beam position to the correct location after a stage move
