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Physical Electronics has introduced a new XPS software feature called image registration, previously only available for O'Jays spectroscopy. This optional add-on enhances small area XPS analysis by ensuring analysis is performed at the precise location of interest, even for very small features. Image registration is used in the analysis of three different samples: a metallized wafer pad, a solder ball, and a particle of manganese carbonate. To set up image registration, distinct feature and search areas are defined, allowing for adjustment of the x-ray beam position to the correct location after a stage move.
