Whether you are already used to working with XPS or handling this format for the first time, editing it should not feel like a challenge. Different formats might require particular apps to open and edit them effectively. However, if you need to swiftly adapt image in XPS as a part of your usual process, it is advisable to get a document multitool that allows for all types of such operations without additional effort.
Try DocHub for streamlined editing of XPS and other document formats. Our platform offers effortless papers processing regardless of how much or little prior experience you have. With all instruments you need to work in any format, you will not have to switch between editing windows when working with each of your documents. Easily create, edit, annotate and share your documents to save time on minor editing tasks. You will just need to register a new DocHub account, and you can start your work instantly.
See an improvement in document processing productivity with DocHub’s simple feature set. Edit any document easily and quickly, irrespective of its format. Enjoy all the advantages that come from our platform’s simplicity and convenience.
[Music] physical electronics is excited to introduce a new XPS software feature called image registration this optional smartsoft add-on which is previously only available for OJays spectroscopy greatly enhances small area xbs analysis image registration is coupled with Phis unique SX I x-ray imaging capability to ensure XPS analysis is performed at the precise location of interest even for very small features in this demonstration image registration will be used during the analysis for three different samples a metallized wafer pad a solder ball and a particle of manganese carbonate as with typical small area analysis and SX I is generated for each feature and the point or points of interest are selected this SX I image can then be designated as a reference image for image registration during image registration setup two areas are defined distinct feature and a search area the distinct feature will be used to adjust the x-ray beam position to the correct location after a stage move