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xps is not a bulk analysis technique if you look in any literature it's called a surface analysis technique it gives you chemical analysis very neatly of the top outer 10 nanometers that's about 30 atomic layers and is considerably different most of the time to the bulk because the sample has been exposed to some solution being exposed to the air some samples are very reactive and so you get a different chemical composition on the outer surface than you do into the bulk here's a few things 10 amp strong's one nanometer we look at about 10 nanometers about a hundred amstrongs quite different from the x-ray techniques of the microscope where we're looking at one to five microns down now there's many surface analysis techniques you go into the literature you'll probably see 20 or 30 techniques sam scanning oj secondary ion mass spectrometry atomic force microscopy etc etc i think by far the most important is xps earlier referred to as eska electron spectroscopy for chemical analysis why...
